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Probe card

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  Parametric Probe card

  ・Enable to measure under the low / high temperature（-55 deg.C～200 deg.C ）

  ・Measurable the low current（<10ｆA)

  ・Corresponding with Agilent 4060,4070,4080

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  Probe Card for High Power Measurement

  Supports voltage application of 10 kV
  or more and large current measurement
  of 200 A or more

  ・Correspondence of 1 o kV, 200 A or
  more
  ・Structure to prevent discharge at high
  voltage
  ・ High current support using iridium needle

  ・Connection to each measuring instrument

  ・Supports from development line to
  mass production line

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  DC multi-contact probe

  It can be installed in the positioner
  with the s a me shape as the high
  frequency probe

  ・LCR chip parts can be mounted in the
  vicinity of the device for countermeasures
  against oscillation supports
  random pin pitch

  ・Possible up to 20 pins

  ・Can be made with tungsten, BeCu,
  Pd, Ir needle

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  Probe card for high frequency measurement

  Use coaxial probe to achieve superior
  high frequency characteristics

  ・Excellent high frequency characteristics

  ・Reduced test cost

  ・Quick delivery

   

  <Usage example>

  ・SAW filter・RF switch・LNA

  ・Bluetooth, IC for wireless LAN

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  Probe card for measuring small current

  Measurement at high temperature,
  small current measurement possible

  ・Low temperature -60°C to 350°C

  ・Minimum current measurement at fA level

  ・4.5 inch rectangular substrate compatible

  ・4070/4080 tester compatible

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  Cantilever probe card for mass production

  Cantilever type with xcellent cost performance

   

  ・It corresponds to about 300 pin

  ・Multi correspondence correspondence

  ・Low cost and lower test cost

  ・Quick delivery

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